One useful advantage of Delcom’s eddy current meters is their ability to measure multiple layers. In order to read individual multiple layers, the user must read the first conductive layer, then coat the material again and take a second reading. The conductance of the second layer can be inferred by subtracting the value of the first reading from the value of the second reading.

In a benchtop setting, the user simply needs to measure the material after the first coating, coat the material again, and then measure the material a second time.

In an inline setting, this process can easily be accomplished by placing one sensor before the second coating process and a second sensor after the second coating process.