Applications

For over 40 years Delcom sensors have been used to achieve higher material and thin film quality in the following applications:

  • Crystalline Solar

    Monocrystalline, Epitaxial, Polycrystalline, Ribbon silicon and Mono-like-multi silicon (MLM) silicon

  • Film Capacitors

    Aluminum and Zinc on PP, PET, PEN, PPS, PTFE, PS, and PC

  • Low E Glass

    Passive Low-E glass (hard coat pyrolytic process, solar control and passive Low-E glass (off-line soft coating process)

  • Microwave Susceptors

    Monitor in situ during deposition, before or after lamination, or after patterning, cutting, and glueing

  • Packaging

    Aluminum, Nickel, Chromium on Polypropylene, BOPP, PET, Nylon, Polyethylene, and OPP

  • Printed Electronics

    Ag, Au, Pt, Cu, nananoparticles, polymers, carbon as well as semiconductor and dielectric inks on glass, silicon, paper, foil, PET, plastic, fabric

  • Semiconductors

    Inline monitoring (including tool integration) during deposition, doping, etching, annealing, polishing, etc. Characterization via single point testing and mapping. Wafer surface defect characterization.

  • Smart Glass

    Photochromatic, thermochromic smart glass. Active smart glass (PDLC, SPD, and Electrochromic/electrochromatic).

  • Transparent Conductors

    Transparent conducting materials (TCMs), Transparent Conducting Films (TCFs), Transparent Conducting Oxides (TCOs

  • Auto Mirrors

    Plastic and glass of varying thickness, shape, and curvature coated with Aluminum, silver, etc.

  • Batteries & Storage

    Cathode, anode, electrode, current collector characterization during deposition, calendaring, and drying processes

  • Boules & Ingots

    Verify doping, identify defects and dislocations

  • CNT and Graphene

    In process monitoring during manufacture, in powder form, or coated on materials

  • Displays

    Inline monitoring, characterization, and qualification of rigid and flexible ITOs, TCOs, TCMs nanowires, meshes, and grids

  • EMI and ESD

    Measure sheet resitance of sheidling and disapative coatings, materials, and structures

  • Flexible Electronics

    Measure sheet resistance and thickness. Identify issues such as cracking and bonding failures.

  • Metalized Films

    Inline downsteam and crossweb monitoring in nearly all deposition processes

  • Thin Film Heaters

    Characterize thickness and sheet resistance of rigid and flexible thin film heater elements

  • Thin Film Solar

    CdTe, CIGS, Amorphous silicon, Protocrystalline silicon, Gallium arsenide thin film

  • Wires, Meshes, & NanoWires

    Characterize sheet resistance of wires, meshes, and nanowires that four point probes cannot measure

  • Woven Materials

    Characterize sheet resistance of woven materials that four point probes cannot measure